First-authored, refereed papers of Alberto Alvarez-Herrero

A list of first-authored, refereed publications of Alberto Alvarez-Herrero, derived from the SAO/NASA Astrophysics Data System (ADS). The number in brackets after each title indicates the number of citations that the paper has received.

Orcid ID: 0000-0001-9228-3412

List of publications ordered by citations
Number of papers: 9
No. of citations: 151

2018

1. Fine tuning method for optimization of liquid crystal based polarimeters [15]
   Álvarez-Herrero, Alberto, Parejo, Pilar García & Silva-López, Manuel, Optics Express, 26, 12038

2008

1. Temperature dependence of the optical and kinetic properties of photochromic spirooxazine derivatives in sol-gel thin films [1]
   Alvarez-Herrero, Alberto, Garranzo, Daniel, Pardo, Rosario, Zayat, Marcos & Levy, David, Physica Status Solidi C Current Topics, 5, 1160

2007

1. Ellipsometric analysis of the spectral properties and dynamic transitions of photochromic thin films [5]
   Alvarez-Herrero, Alberto, Pardo, Rosario, Zayat, Marcos & Levy, David, Journal of the Optical Society of America B Optical Physics, 24, 2097

2004

1. Water adsorption in porous TiO2 SiO2 sol gel films analyzed by spectroscopic ellipsometry [9]
   Alvarez-Herrero, A., Thin Solid Films, 455-456, 356
2. High-Sensitivity Sensor of Low Relative Humidity Based on Overlay on Side-Polished Fibers [50]
   Alvarez-Herrero, Alberto, Guerrero, Héctor & Levy, David, IEEE Sensors Journal, 4, 52

2002

1. Analysis of nanostructured porous films by measurement of adsorption isotherms with optical fiber and ellipsometry [11]
   Álvarez-Herrero, Alberto, Guerrero, Hector, Bernabeu, Eusebio & Levy, David, Applied Optics, 41, 6692

2001

1. Adsorption of water on porous Vycor glass studied by ellipsometry [14]
   Álvarez-Herrero, Alberto, Heredero, Raquel L., Bernabeu, Eusebio & Levy, David, Applied Optics, 40, 527

2000

1. High-sensitivity temperature sensor based on overlay on side-polished fibers [21]
   Alvarez-Herrero, A., Guerrero, H., Belenguer, T. & Levy, D., IEEE Photonics Technology Letters, 12, 1043

1999

1. Ellipsometric characterization and influence of relative humidity on TiO2 layers optical properties [25]
   Alvarez-Herrero, A., Thin Solid Films, 349, 212